Electrochemical Oxidation Induced Multi-Level Memory in Carbon-Based Resistive Switching Devices

MLA

Norman Y. Zhou, et al. “Electrochemical Oxidation Induced Multi-Level Memory in Carbon-Based Resistive Switching Devices.” Scientific Reports, vol. 9, no. 1, Feb. 2019, pp. 1–10. EBSCOhost, https://doi.org/10.1038/s41598-018-38249-0.

APA

Norman Y. Zhou, Paola Russo, & Ming Xiao. (2019). Electrochemical Oxidation Induced Multi-Level Memory in Carbon-Based Resistive Switching Devices. Scientific Reports, 9(1), 1–10. https://doi.org/10.1038/s41598-018-38249-0

Chicago

Norman Y. Zhou, Paola Russo, and Ming Xiao. 2019. “Electrochemical Oxidation Induced Multi-Level Memory in Carbon-Based Resistive Switching Devices.” Scientific Reports 9 (1): 1–10. doi:10.1038/s41598-018-38249-0.