Field emission to control nanometer tip-medium distances in probe storage

Authors :: J.C. Lodder
Leon Abelmann
A.J. le Fèbre
Source :: Technical digest of the International Vacuum Nanoelectronics Conference (IVNC 2007), 223-224, STARTPAGE=223;ENDPAGE=224;TITLE=Technical digest of the International Vacuum Nanoelectronics Conference (IVNC 2007)
Publication Year :: 2007
Publisher :: IEEE, 2007.
Abstract: In this work, we present a novel concept for high resolution proximity sensing based on field emission and provide more insight in the vacuum conditions and electronics needed for stable operation. This study is focused on tip-medium distance control, and the aim is to apply this method in a vacuum probe storage device where thousands of field emission probes In this work, we present a novel concept for high resolution proximity sensing based on field emission and provide more insight in the vacuum conditions and electronics needed for stable operation. This study is focused on tip-medium distance control, and the aim is to apply this method in a vacuum probe storage device where thousands of field emission probes were individually positioned at several nanometers above a storage medium.