Back to Search
Start Over
Improvement of transmittance by fabricating broadband subwavelength anti-reflection structures for polycarbonate
- Source :
- Journal of nanoscience and nanotechnology. 11(1)
- Publication Year :
- 2011
-
Abstract
- We report on how to increase transmittance of a 0.2 mm thick polycarbonate (PC) film by periodic subwavelength anti-reflection structures in the visible spectral range. Subwavelength anti-reflection structures like moth-eyes are fabricated into the polycarbonate substrate itself by thermal nano-imprinting lithography (TH-NIL), which uses silicon stamps that have periodic structures such as gratings (lines and spaces) and pillared dots, and are fabricated by laser interference lithography (LIL) and transformer coupled plasma etching. To increase transmittance of a polycarbonate film, we control the periods and shapes of patterns, the number of patterned surfaces, and the overlapping direction of patterns that are fabricated into its surfaces. As a result of this, we show that average transmittance improves as the pattern period gets shorter and as both surfaces of the film are patterned. We also show that the spectrum range gets larger as the pattern period gets shorter and is determined by the longer pattern period in the case of designing a film to have different pattern period on its surfaces. The maximum average transmittance of a polycarbonate film increases up to approximately 6% compared to a bare sample in the 470-800 nm spectral range.
- Subjects :
- Materials science
Plasma etching
Silicon
business.industry
Biomedical Engineering
chemistry.chemical_element
Bioengineering
General Chemistry
Condensed Matter Physics
Laser interference lithography
Optics
chemistry
visual_art
Thermal
Broadband
visual_art.visual_art_medium
Transmittance
Optoelectronics
General Materials Science
Polycarbonate
business
Lithography
Subjects
Details
- ISSN :
- 15334880
- Volume :
- 11
- Issue :
- 1
- Database :
- OpenAIRE
- Journal :
- Journal of nanoscience and nanotechnology
- Accession number :
- edsair.doi.dedup.....cfc5531465741e15822dbddfc00771a4