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Application of a trace formula to the spectra of flat three-dimensional dielectric resonators

Authors :
E. Bogomolny
Achim Richter
Barbara Dietz
M. Miski-Oglu
Stefan Bittner
Institut für Kernphysik [Darmstadt]
Technische Universität Darmstadt (TU Darmstadt)
Laboratoire de Physique Théorique et Modèles Statistiques (LPTMS)
Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)
Institut für Kernphysik
ECT
Source :
Physical Review E : Statistical, Nonlinear, and Soft Matter Physics, Physical Review E : Statistical, Nonlinear, and Soft Matter Physics, American Physical Society, 2012, 85, pp.026203
Publication Year :
2011
Publisher :
arXiv, 2011.

Abstract

The length spectra of flat three-dimensional dielectric resonators of circular shape were determined from a microwave experiment. They were compared to a semiclassical trace formula obtained within a two-dimensional model based on the effective index of refraction approximation and a good agreement was found. It was necessary to take into account the dispersion of the effective index of refraction for the two-dimensional approximation. Furthermore, small deviations between the experimental length spectrum and the trace formula prediction were attributed to the systematic error of the effective index of refraction approximation. In summary, the methods developed in this article enable the application of the trace formula for two-dimensional dielectric resonators also to realistic, flat three-dimensional dielectric microcavities and -lasers, allowing for the interpretation of their spectra in terms of classical periodic orbits.<br />Comment: 13 pages, 12 figures, 1 table

Details

ISSN :
15393755 and 15502376
Database :
OpenAIRE
Journal :
Physical Review E : Statistical, Nonlinear, and Soft Matter Physics, Physical Review E : Statistical, Nonlinear, and Soft Matter Physics, American Physical Society, 2012, 85, pp.026203
Accession number :
edsair.doi.dedup.....ccedc37282ce27a101c2b32edd90b5f0
Full Text :
https://doi.org/10.48550/arxiv.1111.1968