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Observation of the resonantly enhanced resolution of imaging of fluorescent nanospheres due to their coupling to the metallic nanoplasmonic arrays
- Source :
- IEEE Xplore Digital Library, National Aerospace and Electronics Conference 2018 (NAECON 2018), National Aerospace and Electronics Conference 2018 (NAECON 2018), Jul 2018, Dayton, United States. pp.540-543, ⟨10.1109/NAECON.2018.8556781⟩
- Publication Year :
- 2018
- Publisher :
- HAL CCSD, 2018.
-
Abstract
- International audience; Virtual imaging through dielectric microspheres is shown to possess the resolution beyond the classical diffraction limit, but the factors responsible for such resolution are debated in the literature. In this work, we experimentally demonstrated an important role of spectral overlap between the emission band of a fluorescent (FL) object and the spectral peak of localized surface plasmon resonance (LSPR) in the underlying metallic periodic nanostructure. As an object, we used green and blue FL nanospheres placed at the top of Au and Al arrays with different periods. It is shown that the maximal resolution beyond the diffraction limit can be achieved in confocal microscopy of green (blue) FL nanospheres at the top of Au(Al) arrays. Our results provide the first direct evidence for the critically important role of resonant coupling of emission of point-like objects to LSPRs in the underlying nanostructure for achieving the super-resolution.
- Subjects :
- Diffraction
Metallic nanoplasmonic arrays
Nanostructure
Materials science
02 engineering and technology
Dielectric
Superresolution
01 natural sciences
law.invention
Image reconstruction techniques
010309 optics
Confocal microscopy
law
0103 physical sciences
Surface plasmon resonance
Fluorescence microscopy
[PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics]
business.industry
Resolution (electron density)
Localized surface plasmon resonance
021001 nanoscience & nanotechnology
Fluorescence
Optoelectronics
Near-field scanning optical microscope
0210 nano-technology
business
Near-field microscopy
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- IEEE Xplore Digital Library, National Aerospace and Electronics Conference 2018 (NAECON 2018), National Aerospace and Electronics Conference 2018 (NAECON 2018), Jul 2018, Dayton, United States. pp.540-543, ⟨10.1109/NAECON.2018.8556781⟩
- Accession number :
- edsair.doi.dedup.....ccbd73f78afa1e99cc3c854b479a69c0
- Full Text :
- https://doi.org/10.1109/NAECON.2018.8556781⟩