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Laser Processing For 3D Junctionless Transistor Fabrication

Authors :
F. Balestra
C. Perrot
Joris Lacord
Didier Lattard
Perrine Batude
Benoit Sklenard
V. Benevent
P. Acosta Alba
Sebastien Kerdiles
D. Bosch
Claire Fenouillet-Beranger
J. Lassarre
J. Richy
Francois Andrieu
J.-P. Colinge
Laurent Brunet
Source :
2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
Publication Year :
2020
Publisher :
arXiv, 2020.

Abstract

To take fully advantage of Junctionless transistor (JLT) low-cost and low-temperature features we investigate a 475 degC process to create onto a wafer a thin poly-Si layer on insulator. We fabricated a 13nm doped (Phosphorous, 1E19 at/cm3) poly-silicon film featuring excellent roughness values (Rmax= 1.6nm and RMS=0.2nm). Guidelines for grain size optimization using nanosecond (ns) laser annealing are given.

Details

ISBN :
978-1-72813-523-6
ISBNs :
9781728135236
Database :
OpenAIRE
Journal :
2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
Accession number :
edsair.doi.dedup.....c9ce1f179d7606adeb1a27fcb299c07c
Full Text :
https://doi.org/10.48550/arxiv.2011.15061