Cite
Application of convergent beam electron diffraction to two-dimensional strain mapping in silicon devices
MLA
D. Piccolo, et al. Application of Convergent Beam Electron Diffraction to Two-Dimensional Strain Mapping in Silicon Devices. Jan. 2003. EBSCOhost, https://doi.org/10.1063/1.1565181.
APA
D. Piccolo, Stefano Frabboni, Roberto Balboni, A. G. Cullis, G. Pavia, Aldo Armigliato, G.P. Carnevale, & A. Benedetti. (2003). Application of convergent beam electron diffraction to two-dimensional strain mapping in silicon devices. https://doi.org/10.1063/1.1565181
Chicago
D. Piccolo, Stefano Frabboni, Roberto Balboni, A. G. Cullis, G. Pavia, Aldo Armigliato, G.P. Carnevale, and A. Benedetti. 2003. “Application of Convergent Beam Electron Diffraction to Two-Dimensional Strain Mapping in Silicon Devices,” January. doi:10.1063/1.1565181.