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Element-specific imaging of magnetic domains at 25 nm spatial resolution using soft x-ray microscopy
- Source :
- ResearcherID
- Publication Year :
- 2001
- Publisher :
- AIP Publishing, 2001.
-
Abstract
- The combination of magnetic circular dichroism as a magnetic contrast mechanism and a transmission x-ray microscope allows imaging of magnetic structures with lateral resolutions down to 25 nm. Results on magneto-optical Tb25(Fe75Co25)75 layers system with thermomagnetically written bits of various sizes were obtained at the x-ray microscope XM-1 at the Advanced Light Source in Berkeley, CA. The results prove the thermal stability of the bits in the recording process. Furthermore the capability of soft x-ray microscopy with respect to the achievable lateral resolution, element specificity and sensitivity to thin magnetic layers is demonstrated. The potential of imaging in applied magnetic fields for both out-of-plane and in-plane magnetized thin magnetic films is outlined.
Details
- ISSN :
- 10897623 and 00346748
- Volume :
- 72
- Database :
- OpenAIRE
- Journal :
- Review of Scientific Instruments
- Accession number :
- edsair.doi.dedup.....c4072730b3bb501bb1d1d2381502e87e