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Element-specific imaging of magnetic domains at 25 nm spatial resolution using soft x-ray microscopy

Authors :
T. Eimüller
M. Kumazawa
M. Köhler
A. Pearson
G. Bayreuther
Greg Denbeaux
Gisela Schütz
D T Attwood
Peer Fischer
L. E. Johnson
N. Takagi
Shigeru Tsunashima
Source :
ResearcherID
Publication Year :
2001
Publisher :
AIP Publishing, 2001.

Abstract

The combination of magnetic circular dichroism as a magnetic contrast mechanism and a transmission x-ray microscope allows imaging of magnetic structures with lateral resolutions down to 25 nm. Results on magneto-optical Tb25(Fe75Co25)75 layers system with thermomagnetically written bits of various sizes were obtained at the x-ray microscope XM-1 at the Advanced Light Source in Berkeley, CA. The results prove the thermal stability of the bits in the recording process. Furthermore the capability of soft x-ray microscopy with respect to the achievable lateral resolution, element specificity and sensitivity to thin magnetic layers is demonstrated. The potential of imaging in applied magnetic fields for both out-of-plane and in-plane magnetized thin magnetic films is outlined.

Details

ISSN :
10897623 and 00346748
Volume :
72
Database :
OpenAIRE
Journal :
Review of Scientific Instruments
Accession number :
edsair.doi.dedup.....c4072730b3bb501bb1d1d2381502e87e