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Noise Measurements on MnSi thin films

Authors :
Mitschek, Merlin
Schroeter, David
Menzel, Dirk
Süllow, Stefan
Müller, Jens
Enz, Christian
Publication Year :
2019
Publisher :
ICLAB, 2019.

Details

Database :
OpenAIRE
Accession number :
edsair.doi.dedup.....c3ef17a5fbd716897c9835bec2bf3a56
Full Text :
https://doi.org/10.5075/epfl-iclab-icnf-269237