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Erratum: Zhang, C. et al., The Effect of Substrate Biasing during DC Magnetron Sputtering on the Quality of VO2 Thin Films and Their Insulator–Metal Transition Behavior. Materials 2019, 12, 2160
- Source :
- Materials, Materials, Vol 13, Iss 5132, p 5132 (2020)
- Publication Year :
- 2020
- Publisher :
- MDPI, 2020.
-
Abstract
- The authors would like to correct a typographical error in their paper [...]
- Subjects :
- Materials science
ComputerApplications_COMPUTERSINOTHERSYSTEMS
Insulator (electricity)
Data_CODINGANDINFORMATIONTHEORY
lcsh:Technology
Metal
General Materials Science
Thin film
lcsh:Microscopy
lcsh:QC120-168.85
lcsh:QH201-278.5
lcsh:T
business.industry
Biasing
Sputter deposition
n/a
lcsh:TA1-2040
visual_art
ComputingMethodologies_DOCUMENTANDTEXTPROCESSING
visual_art.visual_art_medium
Optoelectronics
lcsh:Descriptive and experimental mechanics
lcsh:Electrical engineering. Electronics. Nuclear engineering
Erratum
lcsh:Engineering (General). Civil engineering (General)
business
lcsh:TK1-9971
Subjects
Details
- Language :
- English
- ISSN :
- 19961944
- Volume :
- 13
- Issue :
- 22
- Database :
- OpenAIRE
- Journal :
- Materials
- Accession number :
- edsair.doi.dedup.....c1004c79ee0625814964f20c1842f074