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Degradation analysis of PV technologies using NREL and Gantner instruments outdoor data

Authors :
Juergen Sutterlueti
Steve Ransome
Source :
2017 IEEE 44th Photovoltaic Specialist Conference (PVSC).
Publication Year :
2017
Publisher :
IEEE, 2017.

Abstract

Energy yield predictions vs. time depend on both the degradation rates and which parameters are affected e.g. I SC , FF, V OC , R SC , and/or R OC . These cause site dependent energy yield changes (due to the varying fraction of energy generated vs. irradiance or temperature). This study uses outdoor measurements from the publically available NREL data set and also Gantner Instruments' (GI) in-house data from AZ. Analysis is performed with the normalised matrix method vs. the SRCL/GI Loss Factors Model. The LFM can better identify and quantify degradation including R SC and R OC changes. For best understanding these needed the higher quality data from Gantner Instruments measurements rather than NREL which has difficulty finding R SHUNt .

Details

Database :
OpenAIRE
Journal :
2017 IEEE 44th Photovoltaic Specialist Conference (PVSC)
Accession number :
edsair.doi.dedup.....c06eee6bf8d361cde113f4aefb9b6533
Full Text :
https://doi.org/10.1109/pvsc.2017.8366808