Additional file 1 of Microscopic evidence of strong interactions between chemical vapor deposited 2D MoS2 film and SiO2 growth template

Additional file 1: Figure S1. Raman spectra of the MoS2 thin film on the SiO2/Si substrate. Lateral growth of multilayer MoS2 film has been successful. The two characteristic Raman vibration modes E12g and A1g are labelled. Figure S2. TEM images of MoS2 film on SiO2/Si. (a) Low magnification, (b), (c) HRTEM images of AS-MoS2 film. (d) Low magnification, (e), (f) HRTEM images of TR-MoS2 film. Figure S3. (a) Position in which interlayer distance values are measured in AS-MoS2 films and (b) position in which interlayer distance values are measured in TR-MoS2 films. Figure S4. XPS spectra of MoS2 films. XPS core level spectra of (a) Mo 3d, (b) S 2p of AS-MoS2 film and (c) Mo 3d, (d) S 2p of TR-MoS2 films.