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Solution-Processed Silicane Field-Effect Transistor: Operation Due to Stacking Defects on the Channel

Authors :
Atsushi Miura
Hideyuki Nakano
Kenji Ito
Yutaka Majima
Source :
Advanced Functional Materials. 30
Publication Year :
2020

Details

Language :
English
Volume :
30
Database :
OpenAIRE
Journal :
Advanced Functional Materials
Accession number :
edsair.doi.dedup.....bf2d56d2e204828da54f9bbe12730f99