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Study of threshold voltage extraction from room temperature down to 4.2 K on 28 nm FD-SOI CMOS technology
- Source :
- Solid-State Electronics, Solid-State Electronics, 2022, 194, pp.108325. ⟨10.1016/j.sse.2022.108325⟩
- Publication Year :
- 2022
- Publisher :
- HAL CCSD, 2022.
-
Abstract
- International audience
Details
- Language :
- English
- ISSN :
- 00381101
- Database :
- OpenAIRE
- Journal :
- Solid-State Electronics, Solid-State Electronics, 2022, 194, pp.108325. ⟨10.1016/j.sse.2022.108325⟩
- Accession number :
- edsair.doi.dedup.....bd0b9435297a497a5f2fe67ac592ed20
- Full Text :
- https://doi.org/10.1016/j.sse.2022.108325⟩