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A Simple and Robust Method for Estimating Afterpulsing in Single Photon Detectors
- Source :
- Journal of Lightwave Technology. 33:3098-3107
- Publication Year :
- 2015
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2015.
-
Abstract
- Single photon detectors are important for a wide range of applications each with their own specific requirements, which makes necessary the precise characterization of detectors. Here, we present a simple and cost-effective methodology of estimating the dark count rate, detection efficiency, and afterpulsing in single photon detectors purely based on their counting statistics. This methodology extends previous work [IEEE J. Quantum Electron., vol. 47, no. 9, pp. 1251–1256, Sep. 2011], [Electron. Lett., vol. 38, no. 23, pp. 1468–1469, Nov. 2002]: 1) giving upper and lower bounds of afterpulsing probability, 2) demonstrating that the simple linear approximation, put forward for the first time in [Electron. Lett., vol. 38, no. 23, pp. 1468–1469, Nov. 2002], yields an estimate strictly exceeding the upper bound of this probability, and 3) assessing the error when using this estimate. We further discuss the requirements on photon counting statistics for applying the linear approximation to different classes of single photon detectors.
- Subjects :
- Physics
Physics::Instrumentation and Detectors
Dark count rate
business.industry
afterpulsing
single-photon detector
photodiodes
Photon detector
Detector
Physics::Optics
Avalanche photodiode
Atomic and Molecular Physics, and Optics
Characterization (materials science)
Optics
Simple (abstract algebra)
High Energy Physics::Experiment
business
Subjects
Details
- ISSN :
- 15582213 and 07338724
- Volume :
- 33
- Database :
- OpenAIRE
- Journal :
- Journal of Lightwave Technology
- Accession number :
- edsair.doi.dedup.....bbd8019a01ede1a3da0f45ac406c63ae