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Pulse power measurements and attenuator characterization of the hard X-ray beamline at the Linac Coherent Light Source

Authors :
Henrik T. Lemke
Kai Tiedtke
Makina Yabashi
Masahiro Kato
Mathias Richter
Andrey Sorokin
Roberto Alonso-Mori
Sanghoon Song
Yiping Feng
Norio Saito
Matthieu Chollet
U. Jastrow
Aymeric Robert
Kensuke Tono
James M. Glownia
M. Sikorski
Stefan Moeller
Hae Ja Lee
Gabriella Carini
Shigeki Owada
Diling Zhu
Takahiro Tanaka
Mark S. Hunter
Tschentscher, Thomas
Patthey, Luc
Zangrando, Marco
Tiedtke, Kai
Source :
SPIE 1103810 pp. (2019). doi:10.1117/12.2520827, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V : [Proceedings]-SPIE, 2019.-ISBN 97815106274209781510627437-doi:10.1117/12.2520827, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V : [Proceedings]-SPIE, 2019.-ISBN 97815106274209781510627437-doi:10.1117/12.2520827X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation, Prague, Czech Republic, 2019-04-01-2019-04-04
Publication Year :
2019
Publisher :
SPIE, 2019.

Abstract

X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V : [Proceedings] - SPIE, 2019. - ISBN 97815106274209781510627437 - doi:10.1117/12.2520827 X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation, Prague, Czech Republic, 1 Apr 2019 - 4 Apr 2019; SPIE 1103810 pp. (2019). doi:10.1117/12.2520827<br />The absolute power of the Linac Coherent Light Source pulses has been measured accurately in the hard X-raybeamline by using simultaneously two detectors:1 an X-ray Gas Monitor Detector (XGMD)2 in tandem witha radiometer.3 From these measurements, we were also able to characterize and calibrate in details our setsof beamline attenuators, in addition to extending an absolute calibration for our beamline intensity monitors.Similarly, we demonstrate that commercial optical power meter has a response in the hard X-ray regime, thatcan be cross-correlated with the absolute power of the LCLS beam.<br />Published by SPIE

Details

Language :
English
Database :
OpenAIRE
Journal :
SPIE 1103810 pp. (2019). doi:10.1117/12.2520827, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V : [Proceedings]-SPIE, 2019.-ISBN 97815106274209781510627437-doi:10.1117/12.2520827, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V : [Proceedings]-SPIE, 2019.-ISBN 97815106274209781510627437-doi:10.1117/12.2520827X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation, Prague, Czech Republic, 2019-04-01-2019-04-04
Accession number :
edsair.doi.dedup.....bb6d05082ef499d5f17a34a48478d752
Full Text :
https://doi.org/10.1117/12.2520827