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Pulse power measurements and attenuator characterization of the hard X-ray beamline at the Linac Coherent Light Source
- Source :
- SPIE 1103810 pp. (2019). doi:10.1117/12.2520827, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V : [Proceedings]-SPIE, 2019.-ISBN 97815106274209781510627437-doi:10.1117/12.2520827, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V : [Proceedings]-SPIE, 2019.-ISBN 97815106274209781510627437-doi:10.1117/12.2520827X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation, Prague, Czech Republic, 2019-04-01-2019-04-04
- Publication Year :
- 2019
- Publisher :
- SPIE, 2019.
-
Abstract
- X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V : [Proceedings] - SPIE, 2019. - ISBN 97815106274209781510627437 - doi:10.1117/12.2520827 X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation, Prague, Czech Republic, 1 Apr 2019 - 4 Apr 2019; SPIE 1103810 pp. (2019). doi:10.1117/12.2520827<br />The absolute power of the Linac Coherent Light Source pulses has been measured accurately in the hard X-raybeamline by using simultaneously two detectors:1 an X-ray Gas Monitor Detector (XGMD)2 in tandem witha radiometer.3 From these measurements, we were also able to characterize and calibrate in details our setsof beamline attenuators, in addition to extending an absolute calibration for our beamline intensity monitors.Similarly, we demonstrate that commercial optical power meter has a response in the hard X-ray regime, thatcan be cross-correlated with the absolute power of the LCLS beam.<br />Published by SPIE
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- SPIE 1103810 pp. (2019). doi:10.1117/12.2520827, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V : [Proceedings]-SPIE, 2019.-ISBN 97815106274209781510627437-doi:10.1117/12.2520827, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V : [Proceedings]-SPIE, 2019.-ISBN 97815106274209781510627437-doi:10.1117/12.2520827X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation, Prague, Czech Republic, 2019-04-01-2019-04-04
- Accession number :
- edsair.doi.dedup.....bb6d05082ef499d5f17a34a48478d752
- Full Text :
- https://doi.org/10.1117/12.2520827