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Characterization of a new X-linked mental retardation syndrome with microcephaly, cortical malformation, and thin habitus
- Source :
- American Journal of Medical Genetics Part A. :2469-2478
- Publication Year :
- 2009
- Publisher :
- Wiley, 2009.
-
Abstract
- X-linked mental retardation (XLMR) affects 1-2/1,000 males and accounts for approximately 10% of all mental retardation (MR). We have ascertained a syndromic form of XLMR segregating within a five-generation family with seven affected males. Prominent characteristics include mild to severe MR, cortical malformation, microcephaly, seizures, thin build with distinct facial features including a long and thin face, epicanthic folds, almond-shaped eyes, upslanting palpebral fissures and micrognathia and behavioral problems. Carrier females have normal physical appearance and intelligence. This combination of features is unreported and distinct from Lujan-Fryns syndrome, Snyder-Robinson syndrome, and zinc finger DHHC domain-containing 9-associated MR. We propose the name of this new syndrome to be CK syndrome.
- Subjects :
- Adult
Male
medicine.medical_specialty
Microcephaly
Adolescent
Central nervous system disease
Fatal Outcome
Pregnancy
Internal medicine
Genetics
medicine
Humans
Child
Genetics (clinical)
X chromosome
Cerebral Cortex
CK SYNDROME
business.industry
Infant, Newborn
Facies
Infant
Anatomy
Middle Aged
Cortical dysplasia
Hand
medicine.disease
Magnetic Resonance Imaging
Thin build
Pedigree
Radiography
Developmental disorder
Endocrinology
Thin habitus
Child, Preschool
Mental Retardation, X-Linked
Body Constitution
Female
business
Subjects
Details
- ISSN :
- 15524833 and 15524825
- Database :
- OpenAIRE
- Journal :
- American Journal of Medical Genetics Part A
- Accession number :
- edsair.doi.dedup.....bb4549cf30e7b370978acee35fde0006
- Full Text :
- https://doi.org/10.1002/ajmg.a.33071