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Characterization of a new X-linked mental retardation syndrome with microcephaly, cortical malformation, and thin habitus

Authors :
Tracey Oh
Cornelius F. Boerkoel
Kenneth J. Poskitt
Michelle Demos
Laura Arbour
Athena Chou
Tanya N. Nelson
Nataliya Tyshchenko
Margot I. Van Allen
Jingyi Yin
Barbara McGillivray
Andreas Rump
Robin Friedlander
Christèle du Souich
Jane Hurlburt
Source :
American Journal of Medical Genetics Part A. :2469-2478
Publication Year :
2009
Publisher :
Wiley, 2009.

Abstract

X-linked mental retardation (XLMR) affects 1-2/1,000 males and accounts for approximately 10% of all mental retardation (MR). We have ascertained a syndromic form of XLMR segregating within a five-generation family with seven affected males. Prominent characteristics include mild to severe MR, cortical malformation, microcephaly, seizures, thin build with distinct facial features including a long and thin face, epicanthic folds, almond-shaped eyes, upslanting palpebral fissures and micrognathia and behavioral problems. Carrier females have normal physical appearance and intelligence. This combination of features is unreported and distinct from Lujan-Fryns syndrome, Snyder-Robinson syndrome, and zinc finger DHHC domain-containing 9-associated MR. We propose the name of this new syndrome to be CK syndrome.

Details

ISSN :
15524833 and 15524825
Database :
OpenAIRE
Journal :
American Journal of Medical Genetics Part A
Accession number :
edsair.doi.dedup.....bb4549cf30e7b370978acee35fde0006
Full Text :
https://doi.org/10.1002/ajmg.a.33071