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Optimized hole injection with strong electron acceptors at organic-metal interfaces
- Source :
- Physical review letters 95, 237601 (2005). doi:10.1103/PhysRevLett.95.237601
- Publication Year :
- 2005
- Publisher :
- APS, 2005.
-
Abstract
- The energy-level alignment at interfaces between three electroactive conjugated organic materials and Au was systematically varied by adjusting the precoverage of the metal substrate with the electron acceptor tetrafluoro-tetracyanoquinodimethane (F4-TCNQ). Photoelectron spectroscopy revealed that electron transfer from Au to adsorbed F4-TCNQ was responsible for lowering the hole-injection barrier by as much as 1.2 eV. This novel interface modification scheme is independent of the charge transfer complex formation ability of the organic materials with the electron acceptor.
- Subjects :
- chemistry.chemical_classification
Materials science
General Physics and Astronomy
Heterojunction
Conjugated system
Electron acceptor
Photochemistry
Charge-transfer complex
Metal
Electron transfer
Nuclear magnetic resonance
chemistry
Transition metal
X-ray photoelectron spectroscopy
visual_art
visual_art.visual_art_medium
ddc:550
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- Physical review letters 95, 237601 (2005). doi:10.1103/PhysRevLett.95.237601
- Accession number :
- edsair.doi.dedup.....b92cbb4e0bcef4706c74a12be1dad178