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MAX-Phase Films Overcome Scaling Limitations to the Resistivity of Metal Thin Films

Authors :
Joung Eun Yoo
Ju Young Sung
Jin Ha Hwang
Inhee Maeng
Seung-Jae Oh
Inho Lee
Ji Hoon Shim
Sung Dug Kim
Du-Seop Yoon
Seo Young Jang
Young Jae Kang
Sang Woon Lee
Source :
ACS applied materialsinterfaces. 13(51)
Publication Year :
2021

Abstract

Metal thin films have been widely used as conductors in semiconductor devices for several decades. However, the resistivity of metal thin films such as Cu and TiN increases substantially (1000%) as they become thinner (10 nm) when using high-density integration to improve device performance. In this study, the resistivities of MAX-phase V

Subjects

Subjects :
General Materials Science

Details

ISSN :
19448252
Volume :
13
Issue :
51
Database :
OpenAIRE
Journal :
ACS applied materialsinterfaces
Accession number :
edsair.doi.dedup.....b889bf8c74ca7e161e3af9d01c7c20d0