Back to Search
Start Over
Infrared Near-Field Microscopy with the Vanderbilt Free Electron Laser: Overview and Perspectives
- Source :
- Infrared physics & technology 45 (2004): 409. doi:10.1016/j.infrared.2004.01.007, info:cnr-pdr/source/autori:Vobornik D., Margaritondo G., Sanghera J.S., .., Tolk N.H., Congiu-Castellano A., Rizzo M.A., Piston D.W., Somma F., Baldacchini G., Bonfigli F., Marolo T., Flora F., Montereali R.M., Longo G., Mussi V., Generosi R., Luce M., Perfetti P., Cricenti A./titolo:Infrared Near-Field Microscopy with the Vanderbilt Free Electron Laser: Overview and Perspectives/doi:10.1016%2Fj.infrared.2004.01.007/rivista:Infrared physics & technology/anno:2004/pagina_da:409/pagina_a:/intervallo_pagine:409/volume:45
- Publication Year :
- 2004
- Publisher :
- AMSTERDAM:Elsevier Science, 2004.
-
Abstract
- Scanning near-field optical microscopy (SNOM) makes it routinely possible to overcome the fundamental diffraction limit of standard (far-field) microscopy. Recently, aperture-based infrared SNOM performed in the spectroscopic mode, using the Vanderbilt University free electron laser, started delivering spatially-resolved information on the distribution of chemical species and on other laterally-fluctuating properties. The practical examples presented here show the great potential of this new technique both in materials science and in life sciences. (C) 2004 Elsevier B.V. All rights reserved.
- Subjects :
- Infrared Near-field microscopy
Diffraction
SPECTROSCOPY
Materials science
business.industry
Infrared
Resolution (electron density)
Free-electron laser
Physics::Optics
free electron laser
Condensed Matter Physics
Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials
law.invention
CRYSTALS
Chemical species
Optics
RESOLUTION
Optical microscope
law
Microscopy
ABSORPTION
Near-field scanning optical microscope
OPTICAL MICROSCOPY
business
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- Infrared physics & technology 45 (2004): 409. doi:10.1016/j.infrared.2004.01.007, info:cnr-pdr/source/autori:Vobornik D., Margaritondo G., Sanghera J.S., .., Tolk N.H., Congiu-Castellano A., Rizzo M.A., Piston D.W., Somma F., Baldacchini G., Bonfigli F., Marolo T., Flora F., Montereali R.M., Longo G., Mussi V., Generosi R., Luce M., Perfetti P., Cricenti A./titolo:Infrared Near-Field Microscopy with the Vanderbilt Free Electron Laser: Overview and Perspectives/doi:10.1016%2Fj.infrared.2004.01.007/rivista:Infrared physics & technology/anno:2004/pagina_da:409/pagina_a:/intervallo_pagine:409/volume:45
- Accession number :
- edsair.doi.dedup.....b7f8269fda3f8584c0c3c35f00c07c59
- Full Text :
- https://doi.org/10.1016/j.infrared.2004.01.007