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Quantitative 3D analysis of huge nanoparticle assemblies

Authors :
Alfons van Blaaderen
Ana Sánchez-Iglesias
Gustaaf Van Tendeloo
Luis M. Liz-Marzán
Folkert Bleichrodt
Marijn A. van Huis
Willem Jan Palenstijn
Bart de Nijs
Naomi Winckelmans
Daniele Zanaga
Thomas Altantzis
K. Joost Batenburg
Sara Bals
Jan Sijbers
Scientific Computing
Computational Imaging
Source :
Nanoscale, 8(1), 292-299, Nanoscale
Publication Year :
2016
Publisher :
Royal Society of Chemistry (RSC), 2016.

Abstract

Nanoparticle assemblies can be investigated in 3 dimensions using electron tomography. However, it is not straightforward to obtain quantitative information such as the number of particles or their relative position. This becomes particularly difficult when the number of particles increases. We propose a novel approach in which prior information on the shape of the individual particles is exploited. It improves the quality of the reconstruction of these complex assemblies significantly. Moreover, this quantitative Sparse Sphere Reconstruction approach yields directly the number of particles and their position as an output of the reconstruction technique, enabling a detailed 3D analysis of assemblies with as many as 10 000 particles. The approach can also be used to reconstruct objects based on a very limited number of projections, which opens up possibilities to investigate beam sensitive assemblies where previous reconstructions with the available electron tomography techniques failed.

Details

ISSN :
20403372 and 20403364
Volume :
8
Database :
OpenAIRE
Journal :
Nanoscale
Accession number :
edsair.doi.dedup.....b766c0f38a1241b847acc3f78e863c32