Back to Search
Start Over
Hard x-ray photoemission study on strain effect in LaNiO$_3$ thin films
- Publication Year :
- 2021
-
Abstract
- The strain effect from a substrate is an important experimental route to control electronic and magnetic properties in transition-metal oxide (TMO) thin films. Using hard x-ray photoemission spectroscopy, we investigate the strain dependence of the valence states in LaNiO$_{3}$ thin films, strongly correlated perovskite TMO, grown on four substrates: LaAlO$_{3}$, (LaAlO$_{3}$)$_{0.3}$(SrAl$_{0.5}$Ta$_{0.5}$O$_{3}$)$_{0.7}$, SrTiO$_{3}$, and DyScO$_{3}$. A Madelung potential analysis of core-level spectra suggests that the point-charge description is valid for the La ions while it breaks down for Ni and O ions due to a strong covalent bonding between the two. A clear x-ray photon-energy dependence of the valence spectra is analyzed by the density functional theory, which points to a presence of the La 5$p$ state near the Fermi level.<br />6 pages, 4 figures, and 2 tables
- Subjects :
- 010302 applied physics
Valence (chemistry)
Materials science
Strongly Correlated Electrons (cond-mat.str-el)
Physics and Astronomy (miscellaneous)
Condensed matter physics
Photoemission spectroscopy
Fermi level
FOS: Physical sciences
02 engineering and technology
Substrate (electronics)
021001 nanoscience & nanotechnology
01 natural sciences
Ion
symbols.namesake
Condensed Matter - Strongly Correlated Electrons
0103 physical sciences
symbols
Density functional theory
Thin film
0210 nano-technology
Perovskite (structure)
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Accession number :
- edsair.doi.dedup.....b764958222cc2631c530d39bb4c728a4