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Deep Submicron EGFET Based on Transistor Association Technique for Chemical Sensing

Authors :
Nishat T. Tasneem
Antonino S. Fiorillo
Syed K. Islam
Salvatore A. Pullano
Samira Shamsir
Marta Greco
Ifana Mahbub
Source :
Sensors, Volume 19, Issue 5, Sensors, Vol 19, Iss 5, p 1063 (2019), Sensors (Basel, Switzerland)
Publication Year :
2019
Publisher :
Multidisciplinary Digital Publishing Institute, 2019.

Abstract

Extended-gate field-effect transistor (EGFET) is an electronic interface originally developed as a substitute for an ion-sensitive field-effect transistor (ISFET). Although the literature shows that commercial off-the-shelf components are widely used for biosensor fabrication, studies on electronic interfaces are still scarce (e.g., noise processes, scaling). Therefore, the incorporation of a custom EGFET can lead to biosensors with optimized performance. In this paper, the design and characterization of a transistor association (TA)-based EGFET was investigated. Prototypes were manufactured using a 130 nm standard complementary metal-oxide semiconductor (CMOS) process and compared with devices presented in recent literature. A DC equivalence with the counterpart involving a single equivalent transistor was observed. Experimental results showed a power consumption of 24.99 mW at 1.2 V supply voltage with a minimum die area of 0.685 &times<br />1.2 mm2. The higher aspect ratio devices required a proportionally increased die area and power consumption. Conversely, the input-referred noise showed an opposite trend with a minimum of 176.4 nVrms over the 0.1 to 10 Hz frequency band for a higher aspect ratio. EGFET as a pH sensor presented further validation of the design with an average voltage sensitivity of 50.3 mV/pH, a maximum current sensitivity of 15.71 mA1/2/pH, a linearity higher than 99.9%, and the possibility of operating at a lower noise level with a compact design and a low complexity.

Details

Language :
English
ISSN :
14248220
Database :
OpenAIRE
Journal :
Sensors
Accession number :
edsair.doi.dedup.....b6fcccd32396a94f0ff2430b8006a429
Full Text :
https://doi.org/10.3390/s19051063