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Compact Modeling of Nanoscale Trapezoidal FinFETs

Authors :
Charalabos A. Dimitriadis
T.A. Karatsori
N. Fasarakis
Matthias Bucher
Gerard Ghibaudo
D. H. Tassis
A. Tsormpatzoglou
K. A. Papathanasiou
Aristotle University of Thessaloniki, Department of Physics
Electronics Laboratory, Physics Department
Aristotle University of Thessaloniki
Technical University of Crete [Chania]
Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC)
Centre National de la Recherche Scientifique (CNRS)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Université Grenoble Alpes (UGA)
Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS)
Source :
IEEE Transactions on Electron Devices, IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2014, 61 (2), pp.324-332. ⟨10.1109/TED.2013.2284503⟩
Publication Year :
2014
Publisher :
HAL CCSD, 2014.

Abstract

International audience; An analytical compact model for the drain current of undoped or lightly doped nanoscale FinFETs with trapezoidal cross section is proposed. The compact model of rectangular FinFETs is extended to trapezoidal FinFETs using equivalent nonplanar device parameters and corner effects. The model has been validated by comparing the results with those of 3-D numerical device simulations. The very good accuracy of the drain current and transcapacitances makes the proposed model suitable for implementation in circuit simulation tools.

Details

Language :
English
ISSN :
00189383
Database :
OpenAIRE
Journal :
IEEE Transactions on Electron Devices, IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2014, 61 (2), pp.324-332. ⟨10.1109/TED.2013.2284503⟩
Accession number :
edsair.doi.dedup.....b60faf16d1adc8e835100e2ff3eed309
Full Text :
https://doi.org/10.1109/TED.2013.2284503⟩