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An automated testing system for the RD51 VMM hybrid and yield measurement of the first production batches
- Source :
- arXiv pre-print for a publication submitted to NIM A, in review
- Publication Year :
- 2022
-
Abstract
- We present the development of an automated testing system for the VMM hybrid of the RD51 collaboration. The VMM hybrid is a new front-end board for the RD51 common readout system, the Scalable Readout System, and will become the workhorse for the next decade to read out Micro-Pattern Gaseous Detectors. It uses the VMM chip developed for the ATLAS New Small Wheel to convert charge signals from detectors to digital data. Our testing system automatically characterises the quality of the VMM chips on the hybrid after production during multiple tests. Results are evaluated to classify the chips and hybrids and uploaded to a database. We evaluated those results for the first two production batches to measure the production yield. The yield is better than the threshold below which chip testing on a wafer level offers financial benefits. Observations on prominent chip failures were propagated back to the hybrid production process to further increase the yield for future productions. We present the development of an automated testing system for the VMM hybrid of the RD51 collaboration. The VMM hybrid is a new front-end board for the RD51 common readout system, the Scalable Readout System, and will become the workhorse for the next decade to read out Micro-Pattern Gaseous Detectors. It uses the VMM chip developed for the ATLAS New Small Wheel to convert charge signals from detectors to digital data. Our testing system automatically characterises the quality of the VMM chips on the hybrid after production during multiple tests. Results are evaluated to classify the chips and hybrids and uploaded to a database. We evaluated those results for the first two production batches to measure the production yield. The yield is better than the threshold below which chip testing on a wafer level offers financial benefits. Observations on prominent chip failures were propagated back to the hybrid production process to further increase the yield for future productions.
- Subjects :
- Nuclear and High Energy Physics
High Energy Physics - Experiment (hep-ex)
Physics - Instrumentation and Detectors
FOS: Physical sciences
Nuclear Physics - Experiment
Instrumentation and Detectors (physics.ins-det)
Nuclear Experiment (nucl-ex)
Detectors and Experimental Techniques
Instrumentation
Nuclear Experiment
Particle Physics - Experiment
High Energy Physics - Experiment
Subjects
Details
- ISSN :
- 01689002
- Database :
- OpenAIRE
- Journal :
- arXiv pre-print for a publication submitted to NIM A, in review
- Accession number :
- edsair.doi.dedup.....b54688da70c0badbb94a22b96584e358
- Full Text :
- https://doi.org/10.48550/arxiv.2206.00033