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Advances in indirect detector systems for ultra high-speed hard X-ray imaging with synchrotron light
- Source :
- Journal of Instrumentation, Journal of Instrumentation, IOP Publishing, 2018, 13 (04), pp.C04004-C04004. ⟨10.1088/1748-0221/13/04/C04004⟩, Journal of Instrumentation 13(2018), C04004
- Publication Year :
- 2018
- Publisher :
- HAL CCSD, 2018.
-
Abstract
- International audience; We report on indirect X-ray detector systems for various full-field, ultra high-speed X-ray imaging methodologies, such as X-ray phase-contrast radiography, diffraction topography, grating interferometry and speckle-based imaging performed at the hard X-ray imaging beamline ID19 of the European Synchrotron—ESRF. Our work highlights the versatility of indirect X-ray detectors to multiple goals such as single synchrotron pulse isolation, multiple-frame recording up to millions frames per second, high efficiency, and high spatial resolution. Besides the technical advancements, potential applications are briefly introduced and discussed.
- Subjects :
- Ultra high speed
Materials science
X-ray diffraction detectors
[PHYS.MPHY]Physics [physics]/Mathematical Physics [math-ph]
02 engineering and technology
Inspection with x-rays
01 natural sciences
law.invention
[SPI.AUTO]Engineering Sciences [physics]/Automatic
Optics
[PHYS.QPHY]Physics [physics]/Quantum Physics [quant-ph]
law
0103 physical sciences
High spatial resolution
Diffraction topography
[PHYS.MECA.MEFL]Physics [physics]/Mechanics [physics]/Fluid mechanics [physics.class-ph]
[PHYS.MECA.BIOM]Physics [physics]/Mechanics [physics]/Biomechanics [physics.med-ph]
Instrumentation
Mathematical Physics
010302 applied physics
[SPI.ACOU]Engineering Sciences [physics]/Acoustics [physics.class-ph]
[PHYS.MECA.VIBR]Physics [physics]/Mechanics [physics]/Vibrations [physics.class-ph]
business.industry
[SPI.FLUID]Engineering Sciences [physics]/Reactive fluid environment
Detector
[SPI.NRJ]Engineering Sciences [physics]/Electric power
X-ray
X-ray detectors
[CHIM.MATE]Chemical Sciences/Material chemistry
[PHYS.MECA.MSMECA]Physics [physics]/Mechanics [physics]/Materials and structures in mechanics [physics.class-ph]
021001 nanoscience & nanotechnology
Frame rate
Synchrotron
[PHYS.MECA.ACOU]Physics [physics]/Mechanics [physics]/Acoustics [physics.class-ph]
[SPI.ELEC]Engineering Sciences [physics]/Electromagnetism
[CHIM.POLY]Chemical Sciences/Polymers
Beamline
[PHYS.MECA.THER]Physics [physics]/Mechanics [physics]/Thermics [physics.class-ph]
0210 nano-technology
business
Subjects
Details
- Language :
- English
- ISSN :
- 17480221
- Database :
- OpenAIRE
- Journal :
- Journal of Instrumentation, Journal of Instrumentation, IOP Publishing, 2018, 13 (04), pp.C04004-C04004. ⟨10.1088/1748-0221/13/04/C04004⟩, Journal of Instrumentation 13(2018), C04004
- Accession number :
- edsair.doi.dedup.....b3e0efb3856074e8f8f6485f1dce9efe
- Full Text :
- https://doi.org/10.1088/1748-0221/13/04/C04004⟩