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High-aspect-ratio, ultrathick, negative-tone near-UV photoresist and its applications for MEMS

Authors :
Philippe Renaud
Michel Despont
Nicolas Fahrni
Hubert Lorenz
Peter Vettiger
Jürgen Brugger
Source :
ResearcherID
Publication Year :
1998
Publisher :
Elsevier BV, 1998.

Abstract

Detailed investigations of the limits of a new negative-tone near-UV resist (IBM SU-8) have been performed. SU-8 is an epoxy-based resist designed specifically for ultrathick, high-aspect-ratio MEMS-type applications. We have demonstrated that with single-layer coatings, thicknesses of more than 500 μm can be achieved reproducibly. Thicker resist layers can be made by applying multiple coatings, and we have achieved exposures in 1200 μm thick, double-coated SU-8 resist layers. We have found that the aspect ratio for near-UV (400 nm) exposed and developed structures can be greater than 18 and remains constant in the thickness range between 80 and 1200 μm. Vertical sidewall profiles result in good dimensional control over the entire resist thickness. To our knowledge, this is the highest aspect ratio reported for near-UV exposures and the given range of resist thicknesses. These results will open up new possibilities for low-cost LIGA-type processes for MEMS applications. The application potential of SU-8 is demonstrated by several examples of devices and structures fabricated by electroplating and photoplastic techniques. The latter is especially interesting as SU-8 has attractive mechanical properties.

Details

ISSN :
09244247
Volume :
64
Database :
OpenAIRE
Journal :
Sensors and Actuators A: Physical
Accession number :
edsair.doi.dedup.....b35d1b930c7c1a48350f495bbb4cecdf
Full Text :
https://doi.org/10.1016/s0924-4247(98)80055-1