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Stabilizing a graphene platform toward discrete components

Authors :
Alberto Montanaro
Amaia Zurutuza
Stéphane Xavier
Bruno Dlubak
Pierre Seneor
Bernard Servet
Pierre Legagneux
Costel Sorin Cojocaru
Stephan Hofmann
Marie-Blandine Martin
Alba Centeno
Maëlis Piquemal-Banci
John Robertson
Jean-Paul Mazellier
Sana Mzali
Odile Bezencenet
Regina Galceran
Thales Research and Technology [Palaiseau]
THALES
Unité mixte de physique CNRS/Thales (UMPhy CNRS/THALES)
Centre National de la Recherche Scientifique (CNRS)-THALES
University of Cambridge [UK] (CAM)
Laboratoire de physique des interfaces et des couches minces [Palaiseau] (LPICM)
École polytechnique (X)-Centre National de la Recherche Scientifique (CNRS)
Graphenea S.A.
Hofmann, Stephan [0000-0001-6375-1459]
Apollo - University of Cambridge Repository
Source :
Applied Physics Letters, Applied Physics Letters, American Institute of Physics, 2016, 109 (25), pp.253110. ⟨10.1063/1.4972847⟩
Publication Year :
2016
Publisher :
HAL CCSD, 2016.

Abstract

© 2016 Author(s).We report on statistical analysis and consistency of electrical performances of devices based on a large scale passivated graphene platform. More than 500 graphene field effect transistors (GFETs) based on graphene grown by chemical vapor deposition and transferred on 4 in. SiO2/Si substrates were fabricated and tested. We characterized the potential of a two-step encapsulation process including an Al2O3 protection layer to avoid graphene contamination during the lithographic process followed by a final Al2O3 passivation layer subsequent to the GFET fabrication. Devices were investigated for occurrence and reproducibility of conductance minimum related to the Dirac point. While no conductance minimum was observed in unpassivated devices, 75% of the passivated transistors exhibited a clear conductance minimum and low hysteresis. The maximum of the device number distribution corresponds to a residual doping below 5 × 1011 cm−2 (0.023 V/nm). This yield shows that GFETs integrating low-doped graphene and exhibiting small hysteresis in the transfer characteristics can be envisaged for discrete components, with even further potential for low power driven electronics.

Details

Language :
English
ISSN :
00036951
Database :
OpenAIRE
Journal :
Applied Physics Letters, Applied Physics Letters, American Institute of Physics, 2016, 109 (25), pp.253110. ⟨10.1063/1.4972847⟩
Accession number :
edsair.doi.dedup.....b237b26c1552072788b5aa18ccf0aea6
Full Text :
https://doi.org/10.1063/1.4972847⟩