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Low-temperature quantum transport in CVD-grown single crystal graphene

Authors :
Stefano Guiducci
Stefan Heun
Camilla Coletti
Fabio Beltram
Vaidotas Miseikis
Luca Planat
Stefano Roddaro
Shaohua Xiang
Xiang, Shaohua
Miseikis, Vaidota
Planat, Luca
Guiducci, Stefano
Roddaro, Stefano
Coletti, Camilla
Beltram, Fabio
Heun, Stefan
Source :
Nano research, 9 (2016): 1823–1830. doi:10.1007/s12274-016-1075-0, info:cnr-pdr/source/autori:S. H. Xiang, V. Miseikis, L. Planat, S. Guiducci, S. Roddaro, C. Coletti, F. Beltram, and S. Heun/titolo:Low-temperature quantum transport in CVD-grown single crystal graphene/doi:10.1007%2Fs12274-016-1075-0/rivista:Nano research (Print)/anno:2016/pagina_da:1823/pagina_a:1830/intervallo_pagine:1823–1830/volume:9, Nano Research
Publication Year :
2016
Publisher :
Springer Science and Business Media LLC, 2016.

Abstract

Chemical vapor deposition (CVD) has been proposed for large-scale graphene synthesis for practical applications. However, the inferior electronic properties of CVD graphene are one of the key problems to be solved. In this study, we present a detailed study on the electronic properties of high-quality single crystal monolayer graphene. The graphene is grown by CVD on copper using a cold-wall reactor and then transferred to Si/SiO2. Our low-temperature magneto-transport data demonstrate that the characteristics of the measured single-crystal CVD graphene samples are superior to those of polycrystalline graphene and have a quality which is comparable to that of exfoliated graphene on Si/SiO2. The Dirac point in our best samples is located at back-gate voltages of less than 10V, and their mobility can reach 11000 cm2/Vs. More than 12 flat and discernible half-integer quantum Hall plateaus have been observed in high magnetic field on both the electron and hole side of the Dirac point. At low magnetic field, the magnetoresistance shows a clear weak localization peak. Using the theory of McCann et al., we find that the inelastic scattering length is larger than 1 {\mu}m in these samples even at the charge neutrality point.

Details

ISSN :
19980000 and 19980124
Volume :
9
Database :
OpenAIRE
Journal :
Nano Research
Accession number :
edsair.doi.dedup.....b09b5854ea3bbdcb6ac6a7d0d4141d25