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Band structure of the epitaxial Fe/MgO/GaAs(001) tunnel junction studied by x-ray and ultraviolet photoelectron spectroscopies

Authors :
J. C. Le Breton
Philippe Schieffer
Yuan Lu
Guy Jézéquel
Pascal Turban
B. Lépine
Evolution et Diversité Biologique (EDB)
Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3)
Université de Toulouse (UT)-Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS)
Institut de Physique de Rennes (IPR)
Université de Rennes (UR)-Centre National de la Recherche Scientifique (CNRS)
Physique des atomes, lasers, molécules et surfaces (PALMS)
Université de Rennes 1 (UR1)
Université de Rennes (UNIV-RENNES)-Université de Rennes (UNIV-RENNES)-Centre National de la Recherche Scientifique (CNRS)
Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3)
Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées
Source :
Applied Physics Letters, Applied Physics Letters, 2006, 89 (15), ⟨10.1063/1.2361273⟩, Applied Physics Letters, 2006, 89, pp.152106. ⟨10.1063/1.2361273⟩, Applied Physics Letters, American Institute of Physics, 2006, 89, pp.152106. ⟨10.1063/1.2361273⟩, Applied Physics Letters, American Institute of Physics, 2006, 89 (15), ⟨10.1063/1.2361273⟩
Publication Year :
2006
Publisher :
HAL CCSD, 2006.

Abstract

International audience; The electronic band structure in the epitaxial Fe∕MgO∕GaAs(001) tunnel junction has been studied by x-ray and ultraviolet photoelectron spectroscopy measurements. The Schottky barrier height (SBH) of Fe on MgO∕GaAs heterostructure is determined to be 3.3±0.1eV, which sets the Fe Fermi level at about 0.3eV above the GaAs valence band maximum. This SBH is also exactly the same as that measured from Fe on MgO monocrystal. After Fe deposition, no band bending change is observed in MgO and GaAs underlayers. On the contrary, Au and Al depositions led to clear variation of the band bending in both MgO and GaAs layers. This effect is analyzed as a fingerprint of defect states at the MgO∕GaAs interface.

Details

Language :
English
ISSN :
00036951
Database :
OpenAIRE
Journal :
Applied Physics Letters, Applied Physics Letters, 2006, 89 (15), ⟨10.1063/1.2361273⟩, Applied Physics Letters, 2006, 89, pp.152106. ⟨10.1063/1.2361273⟩, Applied Physics Letters, American Institute of Physics, 2006, 89, pp.152106. ⟨10.1063/1.2361273⟩, Applied Physics Letters, American Institute of Physics, 2006, 89 (15), ⟨10.1063/1.2361273⟩
Accession number :
edsair.doi.dedup.....ab359bc14e788ed47e4753c2029cfe45
Full Text :
https://doi.org/10.1063/1.2361273⟩