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MgZnO-Based Negative Capacitance Transparent Thin-Film Transistor Built on Glass

Authors :
Fangzhou Yu
Guangyuan Li
Ming Lu
Yuxuan Li
Yicheng Lu
Wen-Chiang Hong
Source :
IEEE Journal of the Electron Devices Society, Vol 9, Pp 798-803 (2021)
Publication Year :
2021
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2021.

Abstract

We demonstrate the first wide bandgap oxide based negative capacitance transparent thin-film transistor (NC-TTFT) built on glass. The Mg0.03Zn0.97O (MZO) semiconductor served as the channel layer and ferroelectric Ni0.02Mg0.15Zn0.83O (NMZO) serves in the gate stack. The Al-doped ZnO (AZO) is employed as the transparent conductive oxide (TCO) for source and drain electrodes. The NC-TTFT on glass shows an average optical transmittance of 91 % in the visible spectrum. The subthreshold swing (SS) value is significantly reduced over the reference transparent thin-film transistor (TTFT) without a ferroelectric layer. The minimum SS value of the NC-TTFT reaches 17 mV/dec. With normally-off operation and high on/off current ratio of 107, this NC-TTFT on glass technology shows promising potential for wearable systems such as augmented reality (AR) smart glasses.

Details

ISSN :
21686734
Volume :
9
Database :
OpenAIRE
Journal :
IEEE Journal of the Electron Devices Society
Accession number :
edsair.doi.dedup.....a981d6cdf6e48c1d520e3b5479c56fc7