Publisher's Note: 'High sensitivity measurement system for the direct-current, capacitance-voltage, and gate-drain low frequency noise characterization of field effect transistors' [Rev. Sci. Instrum. 87, 044702 (2016)]

Authors :: Graziella Scandurra
O. Giordano
Matteo Rapisarda
Sabrina Calvi
Carmine Ciofi
Gino Giusi
Source :: The Review of scientific instruments. 87(5)
Publication Year :: 2016

Subjects :: Capacitance voltage
Materials science
business.industry
Infrasound
System of measurement
Direct current
Optoelectronics
Field-effect transistor
business
Instrumentation
Sensitivity (electronics)
AND gate
Characterization (materials science)

Tools