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A review of interferometric techniques with possible improvement in pattern resolution using near-field patterning

Authors :
Vadakke Matham Murukeshan
Jian Yi Pae
Asundi, Anand K.
School of Mechanical and Aerospace Engineering
Fifth International Conference on Optical and Photonics Engineering
Source :
SPIE Proceedings.
Publication Year :
2017
Publisher :
SPIE, 2017.

Abstract

In this paper, we will be initially doing review on the advancement of interference lithography (IL) which is a wellestablished technique for its facile, efficient, and economical approach to achieve large-scale patterning in a wide variety of substrates at sub-wavelength resolution. Following this, we have configured a two-beam IL patterning system to achieve patterns in a photoresist and verified against the theoretically calculated results. This work will be further extended using near-field patterning techniques to improve the resolution of the pattern as compared to the current conventional IL system. It is envisaged that the obtained initial results can be employed in a graphene substrate for further research and applications in the area of flexible electronics. MOE (Min. of Education, S’pore) Published version

Details

ISSN :
0277786X
Database :
OpenAIRE
Journal :
SPIE Proceedings
Accession number :
edsair.doi.dedup.....a64a97d6489d09f6c1a1c8d9bb7ddd2e
Full Text :
https://doi.org/10.1117/12.2270638