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Further insights into the photodegradation of poly(3-hexylthiophene) by means of X-ray photoelectron spectroscopy

Authors :
Luc Bideux
Julien Gaume
Guillaume Monier
Matthieu Manceau
Agnès Rivaton
Jean-Luc Gardette
Photochimie moléculaire et macromoléculaire (PMM)
Centre National de la Recherche Scientifique (CNRS)-Université Blaise Pascal - Clermont-Ferrand 2 (UBP)-Institut de Chimie du CNRS (INC)
Laboratoire des sciences et matériaux pour l'électronique et d'automatique (LASMEA)
Université Blaise Pascal - Clermont-Ferrand 2 (UBP)-Centre National de la Recherche Scientifique (CNRS)
Université Blaise Pascal - Clermont-Ferrand 2 (UBP)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)
Source :
Thin Solid Films, Thin Solid Films, Elsevier, 2010, sous presse. ⟨10.1016/j.tsf.2010.06.042⟩, Thin Solid Films, 2010, sous presse. ⟨10.1016/j.tsf.2010.06.042⟩
Publication Year :
2010
Publisher :
Elsevier BV, 2010.

Abstract

International audience; X-ray photoelectron spectroscopy (XPS) was used to monitor the chemical changes resulting from irradiation (> 295 nm) in air of poly(3-hexylthiophene) (P3HT), polymer which is a good candidate for photovoltaic applications. The formation of carbonyl moieties and the stepwise oxidation of sulphur atoms were characterised. The oxidation and the cleavage of the hexyl side-chain was monitored. It is also shown that sulfur was first converted into sulfoxides, then into sulfones and finally into sulfinate esters. The formation of these ultimate degradation products provoked a disruption of π-conjugation in P3HT, leading to diminished visible absorbance. Based on these results, a mechanism of P3HT photooxidation is proposed. Comparison of XPS data with previously reported infrared and UV-visible spectral analysis showed that the information provided by these techniques is completely consistent.

Details

ISSN :
00406090
Volume :
518
Database :
OpenAIRE
Journal :
Thin Solid Films
Accession number :
edsair.doi.dedup.....a4c0419fd40954ed73904846a65999a7