Back to Search Start Over

Development of a hybrid CVD/SOD integration sequence for reliable, high performance interconnect systems

Authors :
Sergio Lucero
Michael E. Mills
L. Archer
S. Cummings
J. Waeterloos
R. Stevens
Steven J. Rozeveld
Y. Ohmoto
E. Beach
Jang-Hi Im
Kwanho Yang
R. Strittmatter
Source :
Microelectronic Engineering. 76:46-51
Publication Year :
2004
Publisher :
Elsevier BV, 2004.

Abstract

The use of hybrid integration schemes is investigated using a combination of a SiOC film at the via level and a porous SiLK Y film at the trench level. Sequential finite element analysis is used to determine the mechanics and, subsequently, a hybrid damascene interconnect is built to demonstrate the approach.

Details

ISSN :
01679317
Volume :
76
Database :
OpenAIRE
Journal :
Microelectronic Engineering
Accession number :
edsair.doi.dedup.....a3998bdb8f71fc44b48c22ba1507988f
Full Text :
https://doi.org/10.1016/j.mee.2004.07.027