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Development of a hybrid CVD/SOD integration sequence for reliable, high performance interconnect systems
- Source :
- Microelectronic Engineering. 76:46-51
- Publication Year :
- 2004
- Publisher :
- Elsevier BV, 2004.
-
Abstract
- The use of hybrid integration schemes is investigated using a combination of a SiOC film at the via level and a porous SiLK Y film at the trench level. Sequential finite element analysis is used to determine the mechanics and, subsequently, a hybrid damascene interconnect is built to demonstrate the approach.
- Subjects :
- Sequence
Interconnection
Materials science
Copper interconnect
Integrated circuit
Condensed Matter Physics
Atomic and Molecular Physics, and Optics
Finite element method
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
law.invention
Search engine
Etching (microfabrication)
law
Chemical-mechanical planarization
Trench
Electronic engineering
Electrical and Electronic Engineering
Porous medium
Science, technology and society
Parametric statistics
Subjects
Details
- ISSN :
- 01679317
- Volume :
- 76
- Database :
- OpenAIRE
- Journal :
- Microelectronic Engineering
- Accession number :
- edsair.doi.dedup.....a3998bdb8f71fc44b48c22ba1507988f
- Full Text :
- https://doi.org/10.1016/j.mee.2004.07.027