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Automatic Success Tree-Based Reliability Analysis for the Consideration of Transient and Permanent Faults

Authors :
Aliee, H.
Michael Glaß
Reimann, F.
Teich, J.
Source :
Scopus-Elsevier
Publication Year :
2013
Publisher :
IEEE Conference Publications, 2013.

Details

Database :
OpenAIRE
Journal :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Accession number :
edsair.doi.dedup.....9c32f6b416a2637e0484d1374fe8a8ed