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Supercapacitor ageing at constant temperature and constant voltage and thermal shock

Authors :
Hamid Gualous
Boubekeur Tala-Ighil
Bertrand Boudart
R. Gallay
Amrane Oukaour
Ph. Makany
Guven Alcicek
Laboratoire de recherche en Electronique, Electrotechnique et Systèmes ( L2ES )
Institut National de Recherche sur les Transports et leur Sécurité ( INRETS ) -Université de Technologie de Belfort-Montbeliard ( UTBM ) -Université de Franche-Comté ( UFC )
Laboratoire Universitaire des Sciences Appliquées de Cherbourg ( LUSAC )
Université de Caen Normandie ( UNICAEN )
Normandie Université ( NU ) -Normandie Université ( NU )
Laboratoire de recherche en Electronique, Electrotechnique et Systèmes (L2ES)
Institut National de Recherche sur les Transports et leur Sécurité (INRETS)-Université de Technologie de Belfort-Montbeliard (UTBM)-Université de Franche-Comté (UFC)
Université Bourgogne Franche-Comté [COMUE] (UBFC)-Université Bourgogne Franche-Comté [COMUE] (UBFC)
Laboratoire Universitaire des Sciences Appliquées de Cherbourg (LUSAC)
Université de Caen Normandie (UNICAEN)
Normandie Université (NU)-Normandie Université (NU)
Source :
Microelectronics Reliability, Microelectronics Reliability, Elsevier, 2010, 50 (9-11), pp.1783-1788. 〈10.1016/j.microrel.2010.07.144〉, Microelectronics Reliability, Elsevier, 2010, 50 (9-11), pp.1783-1788. ⟨10.1016/j.microrel.2010.07.144⟩
Publication Year :
2010
Publisher :
HAL CCSD, 2010.

Abstract

This paper presents supercapacitor ageing according to the voltage, the temperature and thermal shock tests. To investigate this effect, a test bench of accelerated supercapacitor calendar ageing was carried out. Experimental tests are realized at constant temperature when the supercapacitors are polarized at the maximum voltage. To quantify the supercapacitor ageing, the equivalent series resistance (ESR) and the equivalent capacitance (C) are measured using the DC and AC characterization. To lead to the determination of the supercapacitor lifetime, Arrhenius law, that describes the effect of temperature on the velocity of a chemical reaction, is considered. Finally, experimental results of supercapacitor thermal shock are presented.

Details

Language :
English
ISSN :
00262714
Database :
OpenAIRE
Journal :
Microelectronics Reliability, Microelectronics Reliability, Elsevier, 2010, 50 (9-11), pp.1783-1788. 〈10.1016/j.microrel.2010.07.144〉, Microelectronics Reliability, Elsevier, 2010, 50 (9-11), pp.1783-1788. ⟨10.1016/j.microrel.2010.07.144⟩
Accession number :
edsair.doi.dedup.....9955df9c8d1881e3ad1fbbc823dd422b
Full Text :
https://doi.org/10.1016/j.microrel.2010.07.144〉