Back to Search
Start Over
Supercapacitor ageing at constant temperature and constant voltage and thermal shock
- Source :
- Microelectronics Reliability, Microelectronics Reliability, Elsevier, 2010, 50 (9-11), pp.1783-1788. 〈10.1016/j.microrel.2010.07.144〉, Microelectronics Reliability, Elsevier, 2010, 50 (9-11), pp.1783-1788. ⟨10.1016/j.microrel.2010.07.144⟩
- Publication Year :
- 2010
- Publisher :
- HAL CCSD, 2010.
-
Abstract
- This paper presents supercapacitor ageing according to the voltage, the temperature and thermal shock tests. To investigate this effect, a test bench of accelerated supercapacitor calendar ageing was carried out. Experimental tests are realized at constant temperature when the supercapacitors are polarized at the maximum voltage. To quantify the supercapacitor ageing, the equivalent series resistance (ESR) and the equivalent capacitance (C) are measured using the DC and AC characterization. To lead to the determination of the supercapacitor lifetime, Arrhenius law, that describes the effect of temperature on the velocity of a chemical reaction, is considered. Finally, experimental results of supercapacitor thermal shock are presented.
- Subjects :
- Thermal shock
Test bench
020209 energy
02 engineering and technology
7. Clean energy
symbols.namesake
[SPI]Engineering Sciences [physics]
[ SPI.NRJ ] Engineering Sciences [physics]/Electric power
0202 electrical engineering, electronic engineering, information engineering
[ SPI ] Engineering Sciences [physics]
Electrical and Electronic Engineering
Composite material
Safety, Risk, Reliability and Quality
ComputingMilieux_MISCELLANEOUS
Arrhenius equation
Supercapacitor
Equivalent series resistance
Chemistry
business.industry
[SPI.NRJ]Engineering Sciences [physics]/Electric power
Electrical engineering
021001 nanoscience & nanotechnology
Condensed Matter Physics
Atomic and Molecular Physics, and Optics
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Ageing
symbols
0210 nano-technology
business
Constant (mathematics)
Voltage
Subjects
Details
- Language :
- English
- ISSN :
- 00262714
- Database :
- OpenAIRE
- Journal :
- Microelectronics Reliability, Microelectronics Reliability, Elsevier, 2010, 50 (9-11), pp.1783-1788. 〈10.1016/j.microrel.2010.07.144〉, Microelectronics Reliability, Elsevier, 2010, 50 (9-11), pp.1783-1788. ⟨10.1016/j.microrel.2010.07.144⟩
- Accession number :
- edsair.doi.dedup.....9955df9c8d1881e3ad1fbbc823dd422b
- Full Text :
- https://doi.org/10.1016/j.microrel.2010.07.144〉