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Performance of Al–Mn Transition-Edge Sensor Bolometers in SPT-3G

Authors :
M. Korman
Kent D. Irwin
W. L. Holzapfel
J. E. Ruhl
H. M. Cho
Ari Cukierman
V. Novosad
Donna Kubik
C. L. Chang
A. E. Gambrel
Alexandra S. Rahlin
Matt Dobbs
K. Vanderlinde
Keith L. Thompson
D. Howe
M. R. Young
Karen Byrum
Thomas Cecil
R. Basu Thakur
Erik Shirokoff
P. Paschos
Aled Jones
Peter A. R. Ade
Zeeshan Ahmed
Amy N. Bender
Ki Won Yoon
A. H. Harke-Hosemann
K. T. Story
A. E. Lowitz
H. T. Nguyen
D. Dutcher
Antony A. Stark
J. A. Sobrin
J. Stephen
Jason Gallicchio
Lincoln Bryant
Jason W. Henning
J. T. Sayre
S. S. Meyer
Volodymyr Yefremenko
Nathan Whitehorn
John E. Pearson
Peter S. Barry
N. L. Harrington
T. Natoli
Andrew Nadolski
Jessica Avva
G. I. Noble
Carole Tucker
R. Guyser
Stephen Padin
Trupti Khaire
N. Huang
A. Foster
Joshua Montgomery
A. Gilbert
C. M. Posada
Bradford Benson
Robert Gardner
J. F. Cliche
Steve Kuhlmann
Gene C. Hilton
Joaquin Vieira
Chao-Lin Kuo
S. Guns
Graeme Smecher
W. B. Everett
N. W. Halverson
Daniel Michalik
Gensheng Wang
John Groh
J. Fu
E. V. Denison
W. Quan
A. M. Kofman
M. Jonas
Leila R. Vale
Adrian T. Lee
Aritoki Suzuki
Faustin Carter
Junjia Ding
John E. Carlstrom
T. de Haan
E. M. Leitch
D. Riebel
Oliver Jeong
Z. Pan
K. R. Ferguson
Adam Anderson
Source :
Journal of Low Temperature Physics. 199:320-329
Publication Year :
2019
Publisher :
Springer Science and Business Media LLC, 2019.

Abstract

SPT-3G is a polarization-sensitive receiver, installed on the South Pole Telescope, that measures the anisotropy of the cosmic microwave background (CMB) from degree to arcminute scales. The receiver consists of ten 150~mm-diameter detector wafers, containing a total of 16,000 transition-edge sensor (TES) bolometers observing at 95, 150, and 220 GHz. During the 2018-2019 austral summer, one of these detector wafers was replaced by a new wafer fabricated with Al-Mn TESs instead of the Ti/Au design originally deployed for SPT-3G. We present the results of in-lab characterization and on-sky performance of this Al-Mn wafer, including electrical and thermal properties, optical efficiency measurements, and noise-equivalent temperature. In addition, we discuss and account for several calibration-related systematic errors that affect measurements made using frequency-domain multiplexing readout electronics.<br />Comment: 9 pages, 5 figures, submitted to the Journal of Low Temperature Physics: LTD18 Special Edition

Details

ISSN :
15737357 and 00222291
Volume :
199
Database :
OpenAIRE
Journal :
Journal of Low Temperature Physics
Accession number :
edsair.doi.dedup.....977b69f247d8175cb4465acdd72b3121