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The effect of charge collection recovery in silicon p–n junction detectors irradiated by different particles

The effect of charge collection recovery in silicon p–n junction detectors irradiated by different particles

Authors :
Nicola D'Ambrosio
B. Dezillie
Z. Li
S. Grohmann
L. Jungermann
V. K. Eremin
S. Janos
P. Rato Mendes
V. Kalesinskas
O. Hempel
Kevin M. Smith
W. De Boer
E. Grigoriev
Otilia Militaru
Krzysztof Piotrzkowski
Alexander Dierlamm
M.C. Abreu
Vladimir Cindro
S. Pirollo
Igor Mandić
V.G. Palmieri
Erik H.M. Heijne
Wen-Chang Chen
K. Borer
Eugenijus Gaubas
C. Da Via
L. Casagrande
T. Anbinderis
P. Anbinderis
Marko Mikuz
J. Kapturauskas
G. Ruggiero
S. Paul
Klaus Peter Pretzl
Rita De Masi
Val O'Shea
David Menichelli
P. Sousa
E. Wobst
E. M. Verbitskaya
Salvatore Buontempo
M. Zavrtanik
P. Sonderegger
Jaakko Härkönen
Mara Bruzzi
F. Hauler
E. Borchi
T. O. Niinikoski
Sergio Pagano
V. Gorbatenko
V. Granata
Eija Tuominen
R. Herzog
B. Perea Solano
S. Heising
J. Vaitkus
I. Ilyashenko
R. Laiho
Publication Year :
2003

Abstract

The recovery of the charge collection efficiency (CCE) at low temperatures, the so-called ”Lazarus effect”, was studied in Si detectors irradiated by fast reactor neutrons, by protons of medium and high energy, by pions and by gamma-rays. The experimental results show that the Lazarus effect is observed: (a) after all types of irradiation; (b) before and after space charge sign inversion; (c) only in detectors that are biased at voltages resulting in partial depletion at room temperature. The experimental temperature dependence of the CCE for proton-irradiated detectors shows non-monotonic behaviour with a maximum at a temperature defined as the CCE recovery temperature. The model of the effect for proton-irradiated detectors agrees well with that developed earlier for detectors irradiated by neutrons. The same midgap acceptor-type and donor-type levels are responsible for the Lazarus effect in detectors irradiated by neutrons and by protons. A new, abnormal “zigzag”-shaped temperature dependence of the CCE was observed for detectors irradiated by all particles (neutrons, protons and pions) and by an ultra-high dose of γ-rays, when operating at low bias voltages. This effect is explained in the framework of the double-peak electric field distribution model for heavily irradiated detectors. The redistribution of the space charge region depth between the depleted regions adjacent to p+ and n+ contacts is responsible for the “zigzag”- shaped curves. It is shown that the CCE recovery temperature increases with reverse bias in all detectors, regardless of the type of radiation.

Details

Language :
English
Database :
OpenAIRE
Accession number :
edsair.doi.dedup.....94c2c15ed801a51199dba1f39a534a33