MONOX: a characterization tool for the X-UV range

Authors :: R. Barchewitz
Rabah Benbalagh
J.-M. André
Philippe Jonnard
Renaud Delaunay
D. Druart
H. Ringuenet
A. Avila
Laboratoire de Chimie Physique - Matière et Rayonnement (LCPMR)
Université Pierre et Marie Curie - Paris 6 (UPMC)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)
Source :: European Physical Journal: Applied Physics, European Physical Journal: Applied Physics, EDP Sciences, 2005, 31, pp.147-152. ⟨10.1051/epjap:2005047⟩, European Physical Journal: Applied Physics, 2005, 31, pp.147-152. ⟨10.1051/epjap:2005047⟩
Publication Year :: 2005
Publisher :: EDP Sciences, 2005.
Abstract: Publié dans The European Physical Journal - Applied Physics 31, 147 (2005); International audience; A new laboratory apparatus devoted to the characterization of various devices for the X-UV range (100-5000 eV), such as mirrors, diffraction gratings, spectrometers or detectors is described. The apparatus includes open x-ray tubes as x-ray sources, a two-crystal monochromator for wavelength selection and a goniometer. Various examples of its use are presented : dispersive mode where the radiation coming from the x-ray tube is dispersed by the two-crystal monochromator, spectrometric mode where the goniometer is used as a plane x-ray spectrometer and reflectometric mode where a selected wavelength is used to perform absolute reflectivity measurements.

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