Back to Search
Start Over
Enhancement of ballistic efficiency due to source to channel heterojunction barrier in Si metal oxide semiconductor field effect transistors
- Source :
- JOURNAL OF APPLIED PHYSICS. 106(2):024515-024515
- Publication Year :
- 2009
- Publisher :
- American Institute of Physics (AIP), 2009.
-
Abstract
- In this paper, we study the influences of a channel source-end potential profile on the ballistic transport of carriers in Si metal oxide semiconductor field effect transistors (MOSFETs) based on a quantum-corrected Monte Carlo device simulation. As a result, we found that higher ballistic efficiency is expected in MOSFETs with a heterojunction bottleneck barrier, such as Schottky source/drain MOSFETs, compared to that with the conventional p-n junction source and drain. Such a superior ballistic behavior is demonstrated due to the narrower bottleneck potential profile formed at the source-channel interface.
- Subjects :
- Materials science
Silicon
business.industry
Monte Carlo method
General Physics and Astronomy
Schottky diode
chemistry.chemical_element
Heterojunction
Condensed Matter::Mesoscopic Systems and Quantum Hall Effect
Condensed Matter::Materials Science
chemistry
Ballistic conduction
MOSFET
Optoelectronics
Field-effect transistor
business
Communication channel
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 106
- Issue :
- 2
- Database :
- OpenAIRE
- Journal :
- JOURNAL OF APPLIED PHYSICS
- Accession number :
- edsair.doi.dedup.....93151f129b0eeb2239639e53f8d4455e