High-Resolution Quadrature Photopyroelectric Spectroscopy of a-Si:H Thin Films Deposited on Silicon Wafers

MLA

Andreas Mandelis, et al. “High-Resolution Quadrature Photopyroelectric Spectroscopy of a-Si:H Thin Films Deposited on Silicon Wafers.” Applied Spectroscopy, vol. 49, June 1995, pp. 819–24. EBSCOhost, https://doi.org/10.1366/0003702953964624.

APA

Andreas Mandelis, J. Vanniasinkam, Jun Shen, & Andreas Othonos. (1995). High-Resolution Quadrature Photopyroelectric Spectroscopy of a-Si:H Thin Films Deposited on Silicon Wafers. Applied Spectroscopy, 49, 819–824. https://doi.org/10.1366/0003702953964624

Chicago

Andreas Mandelis, J. Vanniasinkam, Jun Shen, and Andreas Othonos. 1995. “High-Resolution Quadrature Photopyroelectric Spectroscopy of a-Si:H Thin Films Deposited on Silicon Wafers.” Applied Spectroscopy 49 (June): 819–24. doi:10.1366/0003702953964624.