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Optimization of the Anodization Processing for Aluminum Oxide Gate Dielectrics in ZnO Thin Film Transistors by Multivariate Analysis

Authors :
Jeff Kettle
Lucas Fugikawa-Santos
Tiago Carneiro Gomes
Dinesh Kumar
Neri Alves
Source :
ACS combinatorial science. 21(5)
Publication Year :
2019

Abstract

The present study reports a two-level multivariate analysis to optimize the production of anodized aluminum oxide (Al2O3) dielectric films for zinc oxide thin-film transistors (TFTs). Fourteen perf...

Details

ISSN :
21568944
Volume :
21
Issue :
5
Database :
OpenAIRE
Journal :
ACS combinatorial science
Accession number :
edsair.doi.dedup.....912b56207289c35e7e7adf82a8c319d6