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Scanning near-field optical nanotomography: a new method of multiparametric 3D investigation of nanostructural materials
- Source :
- Pis'ma v Zhurnal Tekhnicheskoi Fiziki / Technical Physics Letters, Pis'ma v Zhurnal Tekhnicheskoi Fiziki / Technical Physics Letters, MAIK Nauka/Interperiodica (МАИК Наука/Интерпериодика), 2016, 42 (2), pp.171-174. ⟨10.1134/S1063785016020231⟩
- Publication Year :
- 2016
- Publisher :
- HAL CCSD, 2016.
-
Abstract
- International audience; A new experimental approach to multiparametric three-dimensional (3D) investigation of a broad class of composite nanostructural materials is developed on the basis of scanning near-field optical nanotomography (SNONT). Using this method, it is possible to simultaneously study the optical properties, 3D morphology, and distribution of the mechanical and electrical properties of the same region of a sample. The proposed method combines features of the confocal and near-field optical microspectroscopy (fluorescence and Raman spectroscopy) with a lateral resolution of up to 50 nm and scanning-probe microscopy. The possibility of studying the volume distribution of optical, morphological, electrical, and mechanical characteristics of a material with nanoscale resolution is related to the probing of sequential layers at a step of up to 20 nm and a total Z-scan depth of up to 3 mm. In particular, the SNONT method has been used to study a liquid-crystalline polymer doped with fluorescent nanocrystals.
- Subjects :
- 0301 basic medicine
Materials science
Physics and Astronomy (miscellaneous)
Confocal
Hybrid Nanostructural Material
Resolution (electron density)
Composite number
Nanotechnology
Near and far field
02 engineering and technology
021001 nanoscience & nanotechnology
Fluorescence
Correlation Microscopy
03 medical and health sciences
symbols.namesake
030104 developmental biology
Microscopy
symbols
[PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci]
Cantilever Probe
[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
0210 nano-technology
Raman spectroscopy
Nanoscopic scale
Nanoscale Resolution
Subjects
Details
- Language :
- English
- ISSN :
- 10637850 and 10906533
- Database :
- OpenAIRE
- Journal :
- Pis'ma v Zhurnal Tekhnicheskoi Fiziki / Technical Physics Letters, Pis'ma v Zhurnal Tekhnicheskoi Fiziki / Technical Physics Letters, MAIK Nauka/Interperiodica (МАИК Наука/Интерпериодика), 2016, 42 (2), pp.171-174. ⟨10.1134/S1063785016020231⟩
- Accession number :
- edsair.doi.dedup.....9079a58f826fa7c7aabe081958205561