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Scanning near-field optical nanotomography: a new method of multiparametric 3D investigation of nanostructural materials

Authors :
Vladimir Oleinikov
O. I. Agapova
Anton E. Efimov
Igor Nabiev
Konstantin Mochalov
Igor I. Agapov
A. Yu. Bobrovsky
SNOTRA Company (SNOTRA)
The National Research Nuclear University MEPhI (Moscow Engineering Physics Institute) [Moscow, Russia]
Shemyakin-Ovchinnikov Institute of Bioorganic Chemistry (IBCh RAS)
Russian Academy of Sciences [Moscow] (RAS)
Laboratoire de Recherche en Nanosciences - EA 4682 (LRN)
Université de Reims Champagne-Ardenne (URCA)-SFR CAP Santé (Champagne-Ardenne Picardie Santé)
Université de Reims Champagne-Ardenne (URCA)-Université de Picardie Jules Verne (UPJV)-Université de Reims Champagne-Ardenne (URCA)-Université de Picardie Jules Verne (UPJV)-SFR Condorcet
Université de Reims Champagne-Ardenne (URCA)-Université de Picardie Jules Verne (UPJV)-Centre National de la Recherche Scientifique (CNRS)-Université de Reims Champagne-Ardenne (URCA)-Université de Picardie Jules Verne (UPJV)-Centre National de la Recherche Scientifique (CNRS)
Source :
Pis'ma v Zhurnal Tekhnicheskoi Fiziki / Technical Physics Letters, Pis'ma v Zhurnal Tekhnicheskoi Fiziki / Technical Physics Letters, MAIK Nauka/Interperiodica (МАИК Наука/Интерпериодика), 2016, 42 (2), pp.171-174. ⟨10.1134/S1063785016020231⟩
Publication Year :
2016
Publisher :
HAL CCSD, 2016.

Abstract

International audience; A new experimental approach to multiparametric three-dimensional (3D) investigation of a broad class of composite nanostructural materials is developed on the basis of scanning near-field optical nanotomography (SNONT). Using this method, it is possible to simultaneously study the optical properties, 3D morphology, and distribution of the mechanical and electrical properties of the same region of a sample. The proposed method combines features of the confocal and near-field optical microspectroscopy (fluorescence and Raman spectroscopy) with a lateral resolution of up to 50 nm and scanning-probe microscopy. The possibility of studying the volume distribution of optical, morphological, electrical, and mechanical characteristics of a material with nanoscale resolution is related to the probing of sequential layers at a step of up to 20 nm and a total Z-scan depth of up to 3 mm. In particular, the SNONT method has been used to study a liquid-crystalline polymer doped with fluorescent nanocrystals.

Details

Language :
English
ISSN :
10637850 and 10906533
Database :
OpenAIRE
Journal :
Pis'ma v Zhurnal Tekhnicheskoi Fiziki / Technical Physics Letters, Pis'ma v Zhurnal Tekhnicheskoi Fiziki / Technical Physics Letters, MAIK Nauka/Interperiodica (МАИК Наука/Интерпериодика), 2016, 42 (2), pp.171-174. ⟨10.1134/S1063785016020231⟩
Accession number :
edsair.doi.dedup.....9079a58f826fa7c7aabe081958205561