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Filter-Based Ensemble Feature Selection and Deep Learning Model for Intrusion Detection in Cloud Computing

Authors :
C. Kavitha
Saravanan M.
Thippa Reddy Gadekallu
Nimala K.
Balasubramanian Prabhu Kavin
Wen-Cheng Lai
Source :
Electronics, Volume 12, Issue 3, Pages: 556
Publication Year :
2023
Publisher :
Multidisciplinary Digital Publishing Institute, 2023.

Abstract

In recent years, the high improvement in communication, Internet of Things (IoT) and cloud computing have begun complex questioning in security. Based on the development, cyberattacks can be increased since the present security techniques do not give optimal solutions. As a result, the authors of this paper created filter-based ensemble feature selection (FEFS) and employed a deep learning model (DLM) for cloud computing intrusion detection. Initially, the intrusion data were collected from the global datasets of KDDCup-99 and NSL-KDD. The data were utilized for validation of the proposed methodology. The collected database was utilized for feature selection to empower the intrusion prediction. The FEFS is a combination of three feature extraction processes: filter, wrapper and embedded algorithms. Based on the above feature extraction process, the essential features were selected for enabling the training process in the DLM. Finally, the classifier received the chosen features. The DLM is a combination of a recurrent neural network (RNN) and Tasmanian devil optimization (TDO). In the RNN, the optimal weighting parameter is selected with the assistance of the TDO. The proposed technique was implemented in MATLAB, and its effectiveness was assessed using performance metrics including sensitivity, F measure, precision, sensitivity, recall and accuracy. The proposed method was compared with the conventional techniques such as an RNN and deep neural network (DNN) and RNN–genetic algorithm (RNN-GA), respectively.

Details

Language :
English
ISSN :
20799292
Database :
OpenAIRE
Journal :
Electronics
Accession number :
edsair.doi.dedup.....8f92ccd55417c31714b360c8aad019ad
Full Text :
https://doi.org/10.3390/electronics12030556