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A 1.2-V 1.5-Gb/s 72-Mb DDR3 SRAM

Authors :
Young-Jae Son
In-Yeol Lee
Jeong-Suk Yang
Kwon-Il Sohn
Yong-Jin Yoon
Sung-tae Kim
Ahn Kee-Sik
Kim Taehyoung
Hyun-Geun Byun
Jong-Cheol Lee
Uk-Rae Cho
Tae-Gyoung Kang
Dae-Gi Bae
Su-Chul Kim
Nam-Seog Kim
Kang-Young Kim
Kwang-Jin Lee
School of Electrical and Electronic Engineering
Source :
IEEE Journal of Solid-State Circuits. 38:1943-1951
Publication Year :
2003
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2003.

Abstract

A 1.2-V 72-Mb double data rate 3 (DDR3) SRAM achieves a data rate of 1.5 Gb/s using dynamic self-resetting circuits [5]. Single-ended main data lines halve the data line precharging power dissipation and the number of data lines. Clocks phase shifted by 0 , 90 , and 270 are generated through the proposed clock adjustment circuits. The proposed clock adjustment circuits make input data sampled with optimized setup/hold window. On-chip input termination with the linearity error of 4.1% is developed to improve signal integrity at higher data rates. A 1.2-V 1.5-Gb/s 72-Mb DDR3 SRAM is fabricated in a 0.10- m CMOS process with five metals. The cell size and the chip size are 0.845 m2 and 151.1 mm2, respectively. Published version

Details

ISSN :
00189200
Volume :
38
Database :
OpenAIRE
Journal :
IEEE Journal of Solid-State Circuits
Accession number :
edsair.doi.dedup.....8f3ef8194805a66c92fb2d4adb5593d5