Ex situ metrology and data analysis for optimization of beamline performance of aspherical pre-shaped x-ray mirrors at the advanced light source

MLA

Wayne R. McKinney, et al. “Ex Situ Metrology and Data Analysis for Optimization of Beamline Performance of Aspherical Pre-Shaped x-Ray Mirrors at the Advanced Light Source.” Review of Scientific Instruments, vol. 90, Feb. 2019, p. 021711. EBSCOhost, https://doi.org/10.1063/1.5057441.

APA

Wayne R. McKinney, Gevork S. Gevorkyan, Brian V. Smith, Valeriy V. Yashchuk, Tony Warwick, & Ian Lacey. (2019). Ex situ metrology and data analysis for optimization of beamline performance of aspherical pre-shaped x-ray mirrors at the advanced light source. Review of Scientific Instruments, 90, 021711. https://doi.org/10.1063/1.5057441

Chicago

Wayne R. McKinney, Gevork S. Gevorkyan, Brian V. Smith, Valeriy V. Yashchuk, Tony Warwick, and Ian Lacey. 2019. “Ex Situ Metrology and Data Analysis for Optimization of Beamline Performance of Aspherical Pre-Shaped x-Ray Mirrors at the Advanced Light Source.” Review of Scientific Instruments 90 (February): 021711. doi:10.1063/1.5057441.