Using FIB-SEM as a Platform for the Positioning and Correlated Characterization of III-V Nanowires

Authors :: Bjørn-Ove Fimland
Dingding Ren
Vidar Tonaas Fauske
Aleksander B. Mosberg
Antonius T. J. van Helvoort
Source :: Microscopy and Microanalysis
Publication Year :: 2018
Publisher :: Cambridge University Press (CUP), 2018.
Abstract: © 2018. This is the authors’ accepted and refereed manuscript to the article. Locked until 1.2.2019 due to copyright restrictions.

Subjects :: 010302 applied physics
Materials science
0103 physical sciences
Nanowire
Nanotechnology
02 engineering and technology
021001 nanoscience & nanotechnology
0210 nano-technology
01 natural sciences
Instrumentation
Characterization (materials science)

Tools