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Optimization of a Particles Detection Chain Based on a VCO Structure
- Source :
- Journal of Electronic Testing, Journal of Electronic Testing, Springer Verlag, 2016, 32 (1), pp.21-30. ⟨10.1007/s10836-016-5563-7⟩, Journal of Electronic Testing: : Theory and Applications, Journal of Electronic Testing: : Theory and Applications, 2016, 32 (1), pp.21-30. ⟨10.1007/s10836-016-5563-7⟩
- Publication Year :
- 2016
- Publisher :
- HAL CCSD, 2016.
-
Abstract
- International audience; An analysis and optimization of an oscillator based detection chain, dedicated to the conditioning of low input signals, is presented in this paper. The concept is based on an indirect detection of the current generated at the input of the detection chain, through a Voltage Controlled Oscillator (VCO) response. In order to improve the correlation between the input current and the oscillator response (signal recognition), the full characterization of the VCO is presented. The solution enhances the particle recognition with a simple analysis of the VCO output. The new output parameter variations are analyzed and the system resolution is explored.
- Subjects :
- 010302 applied physics
Engineering
010308 nuclear & particles physics
business.industry
Low input
Structure (category theory)
Signal recognition
Hardware_PERFORMANCEANDRELIABILITY
01 natural sciences
Signal
[SPI]Engineering Sciences [physics]
Voltage-controlled oscillator
Chain (algebraic topology)
Control theory
0103 physical sciences
Electronic engineering
Hardware_INTEGRATEDCIRCUITS
Detection theory
Electrical and Electronic Engineering
[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
business
Circuit conditioning
VCO
ComputingMilieux_MISCELLANEOUS
Signal detection
Subjects
Details
- Language :
- English
- ISSN :
- 09238174 and 15730727
- Database :
- OpenAIRE
- Journal :
- Journal of Electronic Testing, Journal of Electronic Testing, Springer Verlag, 2016, 32 (1), pp.21-30. ⟨10.1007/s10836-016-5563-7⟩, Journal of Electronic Testing: : Theory and Applications, Journal of Electronic Testing: : Theory and Applications, 2016, 32 (1), pp.21-30. ⟨10.1007/s10836-016-5563-7⟩
- Accession number :
- edsair.doi.dedup.....8c5032b9a7cf183d6538125797fda675
- Full Text :
- https://doi.org/10.1007/s10836-016-5563-7⟩