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Tests of series quantum Hall arrays based on epitaxial graphene
- Source :
- Novikov, S, Lebedeva, N, Manninen, A & Satrapinski, A 2016, Tests of series quantum Hall arrays based on epitaxial graphene . in Precision Electromagnetic Measurements (CPEM 2016), 2016 Conference on ., 7540653, IEEE Institute of Electrical and Electronic Engineers, pp. 1-2, Conference on Precision Electromagnetic Measurements, CPEM 2016, Ottawa, Canada, 10/07/16 . https://doi.org/10.1109/CPEM.2016.7540653
- Publication Year :
- 2016
- Publisher :
- IEEE Institute of Electrical and Electronic Engineers, 2016.
-
Abstract
- Epitaxial graphene based quantum Hall resistance devices with four and eight series-connected Hall bars have been fabricated and tested for realization of quantum resistance standards with up-scaled values. Triple series connection with external bonding wires was used. Most of the tested devices had relatively low longitudinal resistance and showed half-integer quantum Hall effect at filling factor 2 starting from magnetic field of about 6 T, but the quantized Hall resistance deviated from the expected value much more than in our earlier experiments with four series-connected Hall bars.
- Subjects :
- Materials science
ta114
Condensed matter physics
ta213
Filling factor
020208 electrical & electronic engineering
Quantum point contact
quantum Hall array
02 engineering and technology
graphene fabrication
Quantum Hall effect
021001 nanoscience & nanotechnology
Series and parallel circuits
Condensed Matter::Mesoscopic Systems and Quantum Hall Effect
quantum resistance standard
Magnetic field
Epitaxial graphene
0202 electrical engineering, electronic engineering, information engineering
0210 nano-technology
Bilayer graphene
Quantum
Graphene nanoribbons
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- Novikov, S, Lebedeva, N, Manninen, A & Satrapinski, A 2016, Tests of series quantum Hall arrays based on epitaxial graphene . in Precision Electromagnetic Measurements (CPEM 2016), 2016 Conference on ., 7540653, IEEE Institute of Electrical and Electronic Engineers, pp. 1-2, Conference on Precision Electromagnetic Measurements, CPEM 2016, Ottawa, Canada, 10/07/16 . https://doi.org/10.1109/CPEM.2016.7540653
- Accession number :
- edsair.doi.dedup.....8c074358709dee543bf163eebd1e9f2a